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Test and Measurement: Know It All US$59.95

ELV9781856175302
Test and Measurement: Know It All

Test and Measurement Description

Test and Measurement: Know It All By Jon S. Wilson, Stuart Ball, Creed Huddleston, Edward Ramsden and Dogan Ibrahim

  • 912 pages 564 ills
  • Trim size 7 1/2 X 9 1/4 in
  • Copyright 2008

Test and Measurement Readership

Field Application Engineers; Electronics Engineers; Communications Engineers

Test and Measurement Contents

Chapter 1 Fundamental of measurement

1.1 Introduction

1.2 Fundamental concepts Bibliography

Chapter 2 Sensors and Transducers

2.1 Basic Sensor Technology

2.2 Sensor Systems

2.3 Application Considerations

2.4 Sensor Characteristics

2.5 System Characteristics

2.6 Instrument Selection

2.7 Data Acquisition and Readout

2.8 Installation

2.9 Measurement Issues and Criteria

Chapter 3. Data acquisition hardware and software

3.1 ADCs

3.2 Types of ADCs

3.3 ADC Comparison

3.4 Sample and Hold

3.5 Real Parts

3.6 Microprocessor Interfacing

3.7 Clocked Interfaces

3.8 Serial Interfaces

3.9 Multichannel ADCs

3.10 Internal Microcontroller ADCs

3.11 Codecs

3.12 Interrupt Rates

3.13 Dual-Function Pins on Microcontrollers

3.14 Design Checklist

Chapter 4. Overview of measurement systems

4.1 Transducers

4.2 Methods of measurement

4.3 Sensitivity

4.4 Zero, linearity and span

4.5 Resolution, hysteresis and error

4.6 Fourier analysis

4.7 Dynamic response

4.8 PID control

4.9 Accuracy and repeatability

4.10 Mechanical models

Chapter 5 Acceleration, Shock and Vibration

5.1 Introduction

5.2 Technology Fundamentals

5.3 Selecting and Specifying Accelerometers

5.4 Applicable Standards

5.5 Interfacing and Designs

5.6 Machinery Vibration Monitoring Sensors

Chapter 6 Flow

6.1 General

6.2 Differential pressure flowmeters

6.3 Turbine flowmeters

6.4 Vortex shedding flowmeters

6.5 Electromagnetic flowmeters

6.6 Ultrasonic flowmeters

6.7 Hot wire anemometer

6.8 Mass flowmeters

Chapter 7 Temperature

7.1 Temperature scales

7.2 Types of temperature sensors

7.3 Measurement errors

7.4 Selecting a temperature sensor

7.5 Thermocouple Temperature Sensors

7.6 RTD Temperature Sensors

7.7 Thermistor Temperature Sensors

7.8 Integrated Circuit Temperature Sensors

Chapter 8 Pressure

8.1 Introduction

8.2 SI and other units

8.3 Absolute, gauge and differential pressure modes

8.4 Primary standards

8.5 Spinning ball gauge standard

8.6 Secondary standards

8.7 Working standards

8.8 Pressure measuring instruments

8.9 Calibration of pressure standards and instruments Bibliography

Chapter 9. Position

9.1 Mechanical switch

9.2 Potentiometric sensor

9.3 Capacitive transducer

9.4 LVDT

9.5 Angular velocity transducer

9.6 Position sensitive diode array

9.7 Motion control

Chapter 10 Strain gauges, loadcells and weighing

10.1 Introduction

10.2 Stress and strain

10.3 Strain gauges

10.4 Bridge circuits

10.5 Load cells

10.6 Weighing systems

Chapter 11 Light

11.1 Light

11.2 Measuring light

11.3 Standards of measurement

11.4 Thermal detectors

11.5 Light dependent resistor (LDR)

11.6 Photodiode

11.7 Other semiconductor photodetectors

11.8 Optical detectors

11.9 Photomultiplier

Chapter 12 Signal Processing and Conditioning

12.1 Conditioning Bridge Circuits References

12.2 Amplifiers for Signal Conditioning References

Chapter 13 Interfacing and Data Communications

13.1 Interfacing

13.2 Input/Output ports

13.3 Polling

13.4 Interrupts

13.5 Direct memory access (DMA)

13.6 Serial port

13.7 Serial port addresses

13.8 Serial port registers

13.9 Serial port registers and interrupts

13.10 Serial port baud rate

13.11 Serial port operation

13.12 Parallel printer port

13.13 Parallel port registers

13.14 Parallel printer port operation

13.15 Communications

13.16 Byte to serial conversion

13.17 RS232 interface

13.18 Synchronisation

13.19 UART (6402)

13.20 Line drivers

13.21 UART clock

13.22 UART Master Reset

13.23 Null modem

13.24 Serial port BIOS services

13.25 Serial port operation in BASIC

13.26 Hardware handshaking

13.27 RS485

13.28 GPIB

13.29 USB

13.30 TCP/IP

Chapter 14 Data acquisition software

14.1 An overview of DA&C software

14.2 Data acquisition and control in real time

14.3 Implementing real-time systems on the PC

14.4 Robustness, reliability and safety

Chapter 15. Scaling and calibration

15.1 Scaling of linear response curves

15.2 Linearization

15.3 Polynomial linearization

15.4 Interpolation between points in a look-up table

15.5 Interpolation vs. power-series polynomials

15.6 Interactive calibration programs

15.7 Practical issues

Chapter 16. Synthetic instruments

16.1 What is a Synthetic Instrument?

16.2 History of Automated Measurement

16.3 Synthetic Instruments Defined

16.4 Advantages of Synthetic Instruments

16.5 Synthetic Instrument Misconceptions

16.6 Synthetic Measurement System Hardware Architectures

16.7 System Concept—The CCC Architecture

16.8 Hardware Requirements Traceability

16.9 Stimulus

16.10 Stimulus Digital Signal Processing

16.11 Stimulus Triggering

16.12 The Stimulus D/A

16.13 Stimulus Conditioning

16.14 Stimulus Cascade—Real-World Example

16.15 Real-World Design: A Synthetic Measurement System

16.16 Universal High-Speed RF Microwave Test System

16.17 System Architecture

16.18 DUT Interface

16.19 Calibration

16.20 Software Solutions

16.21 Conclusions

Chapter 17 Real-world measurement applications

17.1 Precision Measurement and Sensor Conditioning References

Chapter 18. Testing methods

18.1 The Order-of-Magnitude Rule

18.2 A Brief (Somewhat Apocryphal) History of Test

18.3 Test Options

18.4 Summary

Chapter 19 Boundary Scan Techniques

19.1 Latch-Scanning Arrangements

19.2 Enter Boundary Scan

19.3 Hardware Requirements

19.4 Modes and Instructions

19.5 Implementing Boundary Scan

19.6 Partial-Boundary-Scan Testing

19.7 Other Alternatives

19.8 Summary

Chapter 20 Inspection Test

20.1 Striking a Balance

20.2 Post-Paste Inspection

20.3 Post-Placement/Post-Reflow

20.4 Summary

Chapter 21 EMC fundamentals

21.1 What is EMC?

21.2 Compatibility between and within systems

Chapter 22 Measuring RF emissions

22.1 Emissions measuring instruments

22.2 Transducers

22.3 Sites and facilities

Chapter 23 Test methods

23.1 Test set-up

23.2 Test procedure

23.3 Tests above 1GHz

23.4 Military emissions tests

23.5 Measurement uncertainty

Chapter 24 Test planning

24.1 The need for a test plan

24.2 Contents of the test plan

24.3 Immunity performance criteria

Chapter 25 Accelerated testing fundamentals

25.1 Scenario One: A key physical property is wrong.

25.2 Scenario Two: A primary failure mode of a product.

25.3 Scenario Three: The Mean Time to Failure (MTTF).

Chapter 26 HALT and FMVT

26.1 A Typical HALT

26.2 Hot Temperature Steps

26.3 Cold Temperature Steps

26.4 Ramp Rates

26.5 Vibration

26.6 Combined Run

26.7 Business Structures

26.8 Failure Mode Verification Testing (FMVT)

26.9 Development FMVT

26.10 More About Stress

26.11 What can break the product?

26.12 More About Failures

26.13 More About Setup and Execution

26.14 More on Data Analysis

26.15 Comparison FMVT

26.16 Method One: Time to First Failure

26.17 Method Two: Failure Mode Progression Comparison

26.18 FMVT Life Prediction – Equivalent Wear and Cycle Counting

26.19 FMVT Warranty

26.20 More on Vibration

26.21 Reliability and Design Maturity

26.22 Business Considerations Appendix A: Standard Interfaces A.1 IEEE 1451.2 A.2 4–20 ma Current Loop A.3 Fieldbus

Test and Measurement Author Information

By Jon S. Wilson, Principal Consultant, The Dynamic Consultant, CA, USA; Stuart Ball, Embedded Systems consultant and author; Creed Huddleston, Real-Time by Design, LLC, Raleigh, NC, USA; Edward Ramsden, Senior Engineer, Lattice Semiconductor, Hillsboro, OR, USA; and Dogan Ibrahim, Traffic Control Systems Unit, South Bank University, Near East University, UK.


This product was added to our catalog on Thursday 25 December, 2008.

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